Interfacial Atomic Number Contrast in Thick Samples
نویسندگان
چکیده
منابع مشابه
Discussion of Electron Induced Atomic Number Contrast
In this paper, atomic number (Z) contrast from electron induced images is revisited. Z contrast obtained with a scanning electron microscope (SEM) is generally associated with the collection of backscattered electrons (BSEs) and is considered to exhibit a monotonic increase in BSE signal with Z [1]. However, there is no monotonic relationship of the backscattering coefficient, η, with Z at elec...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2014
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927614002402